基于改進(jìn)蟻群的測試序列優(yōu)化算法
中國測試期刊
李丹陽， 蔡金燕， 杜敏杰， 朱 賽
（軍械工程學(xué)院光學(xué)與電子工程系，河北 石家莊 050003）
摘 要：針對(duì)故障診斷中的測試序列優(yōu)化問題，提出一種改進(jìn)蟻群算法的解決方法。該方法根據(jù)二值屬性系統(tǒng)的特點(diǎn)，定義狀態(tài)集向量及測試向量，將故障測試隔離過程轉(zhuǎn)化為向量的位運(yùn)算過程，將序列優(yōu)化問題轉(zhuǎn)化為一種最小代價(jià)的動(dòng)態(tài)樹構(gòu)造問題，設(shè)計(jì)靈活的狀態(tài)轉(zhuǎn)移規(guī)則，并根據(jù)動(dòng)態(tài)樹的分層結(jié)構(gòu)特點(diǎn)，提出一種分層加權(quán)和遺傳變異相結(jié)合的信息素更新策略，解決這種動(dòng)態(tài)樹結(jié)構(gòu)的尋優(yōu)問題。仿真結(jié)果表明：該算法以較高的效率收斂到已知最優(yōu)解，高效實(shí)用，為大規(guī)模復(fù)雜系統(tǒng)的測試優(yōu)化問題提供了一條新的解決途徑，具有一定的工程應(yīng)用價(jià)值。
關(guān)鍵詞：測試序列優(yōu)化；蟻群算法；二值屬性系統(tǒng)；動(dòng)態(tài)樹
中圖分類號(hào)：TP277；TP391.9；TM571.62；O212.6 文獻(xiàn)標(biāo)志碼：A 文章編號(hào)：1674-5124（2013）04-0105-04
Test sequencing optimization based on improved Ant Algorithm
LI Dan-yang， CAI Jin-yan， DU Min-Jie， Zhu Sai
（Department of Electronic and Optical Engineering，Ordnance Engineering College，Shijiazhuang 050003，China）
Abstract: For solving the problem of test sequencing optimization in fault diagnosis， an improved ant algorithm was presented in this paper. According to the feature of the binary attribute system， state-set vector and test-set vector were defined， the fault testing segregation process was transformed to the process of vector operation and the problem of test sequencing optimization was transformed to construct a dynamic tree with minimum cost. Transfer rule of the ant state was designed and a kind of layered weighted pheromone update mechanism was presented， which combine with the variation in GA and solved the optimization problem of tree-construction. Simulation results show that the algorithm convergences to the optimal solution with high efficiency and provides a new way to solve the test sequencing optimization for large-scale complicated system.
Key words: test sequencing optimization； ant algorithm； binary attribute system； dynamic tree
